Kyoto, Japan

Yoshihisa Onda

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Horiba, Ltd.. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoshihisa Onda. Retrieved from https://idiyas.com/inventor/yoshihisa-onda

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: The Innovations of Yoshihisa Onda

Introduction

Yoshihisa Onda is a notable inventor based in Kyoto, Japan. He has made significant contributions to the field of exhaust gas analysis, particularly through his innovative patent that addresses critical challenges in this area. His work is essential for improving the efficiency and accuracy of exhaust gas sampling mechanisms.

Latest Patents

Yoshihisa Onda holds a patent for an "Exhaust gas sampling mechanism and exhaust gas analysis apparatus." This invention aims to prevent condensed water droplets in exhaust gas from being sampled by a sampling probe. By ensuring that only the gas components of the exhaust gas are measured, his invention maintains a high response speed in analyzing exhaust gases. The mechanism includes a sampling probe positioned in the flow path of the exhaust gas and a gas-permeable cover that features a water droplet removing structure.

Career Highlights

Onda is associated with Horiba, Ltd., a company renowned for its expertise in analytical and measuring instruments. His role at Horiba has allowed him to focus on developing technologies that enhance environmental monitoring and compliance.

Collaborations

Yoshihisa Onda has worked alongside talented colleagues such as Shun Fukami and Kazuo Hanada. Their collaborative efforts contribute to the advancement of technologies in exhaust gas analysis.

Conclusion

Yoshihisa Onda's innovative work in exhaust gas sampling mechanisms showcases his commitment to improving environmental analysis. His contributions are vital for the ongoing development of efficient and accurate measurement technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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