Tokyo, Japan

Yoshihisa Miyamoto

This inventor holds 1 USPTO granted patent. Top assignee: Hakko Co., Ltd.. Active years: 2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoshihisa Miyamoto. Retrieved from https://idiyas.com/inventor/yoshihisa-miyamoto

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: Innovations of Yoshihisa Miyamoto

Introduction

Yoshihisa Miyamoto is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of drying technology. His innovative approach has led to the development of a unique drying method that enhances efficiency.

Latest Patents

Miyamoto holds 1 patent for a drying method, drying device, and drying machine. This invention is designed to remarkably reduce drying time by utilizing a preliminary drying phase. The method involves supplying hot air to the drying machine while simultaneously channeling exhausted hot air into a preliminary drying machine. This dual approach allows for the effective drying of articles, significantly improving the overall process.

Career Highlights

Miyamoto is associated with Hakko Co., Ltd., where he applies his expertise in drying technologies. His work has been instrumental in advancing the company's product offerings and enhancing their market competitiveness.

Collaborations

Miyamoto collaborates with Shigemitsu Hayashi, contributing to the development of innovative solutions in their field. Their partnership exemplifies the synergy between skilled professionals in the industry.

Conclusion

Yoshihisa Miyamoto's contributions to drying technology reflect his commitment to innovation and efficiency. His patent showcases a practical solution that addresses common challenges in the drying process.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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