Omiya, Japan

Yoshihiro Inoue

This inventor holds 1 USPTO granted patent. Top assignee: Mitsubishi Metal Corporation. Active years: 1992.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoshihiro Inoue. Retrieved from https://idiyas.com/inventor/yoshihiro-inoue-a3hudlms

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 1992

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Yoshihiro Inoue: Innovator in Quality Inspection Technology

Introduction

Yoshihiro Inoue is a notable inventor based in Omiya, Japan. He has made significant contributions to the field of quality inspection technology, particularly through his innovative methods and apparatuses.

Latest Patents

Inoue holds a patent for a "Method and apparatus for inspecting quality of manufactured articles." This patent describes a method for inspecting a physical feature on the surface of a manufactured article. The process involves placing a sensor adjacent to the article and sensing the surface while rotating either the sensor or the article. This rotation allows for the collection of signals that correspond to physical features on the surface. The signals are then processed and analyzed based on the number of peaks, providing valuable information regarding the article's physical features.

Career Highlights

Yoshihiro Inoue is associated with Mitsubishi Metal Corporation, where he has applied his expertise in quality inspection. His work has contributed to advancements in manufacturing processes and quality assurance.

Collaborations

Inoue has collaborated with notable colleagues such as Hajime Itoh and Atsuo Itow, enhancing the innovative efforts within his field.

Conclusion

Yoshihiro Inoue's contributions to quality inspection technology exemplify the impact of innovative thinking in manufacturing. His patent reflects a commitment to improving product quality through advanced inspection methods.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…