Hitachi, Japan

Yoshihiko Imura

This inventor holds 1 USPTO granted patent. Top assignee: Hitachi, Ltd.. Active years: 1994.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoshihiko Imura. Retrieved from https://idiyas.com/inventor/yoshihiko-imura-j3lrzg5a

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 24(Granted Patents)


Company Filing History:


Years Active: 1994

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1 patent (USPTO):Explore Patents

Title: Innovations of Yoshihiko Imura

Introduction

Yoshihiko Imura is a notable inventor based in Hitachi, Japan. He has made significant contributions to the field of fault tree analysis and process diagnosis support systems. His innovative approach has led to the development of a unique patent that enhances the efficiency of fault diagnosis.

Latest Patents

Yoshihiko Imura holds a patent for a "Fault tree displaying method and process diagnosis support system." This invention allows for the inference based on fault tree knowledge, enabling guidance and definitions to be displayed on a CRT screen. By selecting individual items from a fault tree using a soft key, users can visualize relevant events related to abnormal courses. The system automatically re-edits the fault tree for better clarity and understanding.

Career Highlights

Imura is associated with Hitachi, Ltd., a leading company in technology and innovation. His work has been instrumental in advancing diagnostic systems, making them more user-friendly and effective. His contributions have been recognized within the industry, showcasing his expertise in fault tree methodologies.

Collaborations

Yoshihiko has collaborated with notable colleagues such as Akira Kaji and Takekazu Maruyama. Their combined efforts have furthered the development of innovative solutions in their field.

Conclusion

Yoshihiko Imura's work exemplifies the spirit of innovation in technology. His patent for a fault tree displaying method significantly enhances process diagnosis support systems. His contributions continue to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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