Zama, Japan

Yoshiharu Sawada

This inventor holds 1 USPTO granted patent. Top assignee: Canon Kabushiki Kaisha. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoshiharu Sawada. Retrieved from https://idiyas.com/inventor/yoshiharu-sawada

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: The Innovations of Yoshiharu Sawada

Introduction

Yoshiharu Sawada is a notable inventor based in Zama, Japan. He has made significant contributions to the field of semiconductor technology. His work has led to the development of innovative devices that enhance imaging capabilities.

Latest Patents

Yoshiharu Sawada holds 1 patent for a semiconductor device and method for manufacturing the same. This patent includes a first waveguide member located in both the imaging region and the peripheral region of a semiconductor substrate. Additionally, it features a via plug that penetrates the first waveguide member, showcasing his expertise in semiconductor design.

Career Highlights

Yoshiharu Sawada is associated with Canon Inc., a leading company in imaging and optical products. His role at Canon has allowed him to work on cutting-edge technologies that push the boundaries of semiconductor applications.

Collaborations

Throughout his career, Yoshiharu has collaborated with talented individuals such as Takehito Okabe and Takashi Usui. These partnerships have fostered innovation and contributed to the success of their projects.

Conclusion

Yoshiharu Sawada's contributions to semiconductor technology exemplify the spirit of innovation. His patent and collaborations reflect his commitment to advancing the field. His work continues to influence the development of new technologies in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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