This inventor holds 1 USPTO granted patent. Top assignee: Ishida Co., Ltd.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Yoshiaki Sakagami: Innovator in X-ray Inspection Technology
Introduction
Yoshiaki Sakagami is a notable inventor based in Ritto, Japan. He has made significant contributions to the field of X-ray inspection technology. His innovative approach has led to the development of advanced inspection apparatuses that enhance the efficiency and accuracy of X-ray imaging.
Latest Patents
Yoshiaki Sakagami holds a patent for an X-ray inspection apparatus. This apparatus includes a conveyance unit, an X-ray irradiation unit, and an X-ray detection unit. The system is designed to generate an X-ray transmission image from the detected X-ray and inspect the article based on this image. Additionally, it features a housing that contains the X-ray units, a cold air blower for cooling, and a monitoring unit that ensures the proper functioning of the cold air blower. In case of any abnormalities, the control unit stops the power supply to the X-ray detection unit, ensuring safety and reliability.
Career Highlights
Sakagami has been instrumental in advancing the technology used in X-ray inspections. His work at Ishida Co., Ltd. has positioned him as a key figure in the development of innovative inspection solutions. His patent reflects his commitment to improving the quality and safety of X-ray inspection processes.
Collaborations
Yoshiaki Sakagami has collaborated with talented individuals such as Futoshi Yurugi and Atsushi Yamakawa. Their combined expertise has contributed to the successful development of cutting-edge technologies in the field.
Conclusion
Yoshiaki Sakagami's contributions to X-ray inspection technology demonstrate his innovative spirit and dedication to enhancing safety and efficiency in industrial applications. His patent for the X-ray inspection apparatus is a testament to his expertise and commitment to advancing technology in this critical field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile