Daejeon, South Korea

Yooseung Wang

This inventor holds 1 USPTO granted patent. Top assignees: Korea Advanced Institute of Science and Technology, Samsung Electronics Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yooseung Wang. Retrieved from https://idiyas.com/inventor/yooseung-wang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Yooseung Wang: Innovator in Image Processing Technology

Introduction

Yooseung Wang is a prominent inventor based in Daejeon, South Korea. He has made significant contributions to the field of image processing, showcasing his expertise through innovative patents and collaborations with leading companies.

Latest Patents

Wang holds a patent for an "Image processing device and operating method thereof." This invention features an image sensor that includes a unit block with a plurality of pixels arranged adjacent to each other. Additionally, the device incorporates a number of nano-posts arranged on the unit block, along with a processor that processes input images acquired through the image sensor. He has 1 patent to his name.

Career Highlights

Throughout his career, Yooseung Wang has worked with notable organizations, including Samsung Electronics Ltd. and the Korea Advanced Institute of Science and Technology. His experience in these institutions has allowed him to refine his skills and contribute to advancements in technology.

Collaborations

Wang has collaborated with talented individuals such as Soongeun Jang and Changick Kim. These partnerships have further enhanced his work in the field of image processing.

Conclusion

Yooseung Wang is a distinguished inventor whose work in image processing technology has made a lasting impact. His innovative patent and collaborations with leading companies highlight his contributions to the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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