Gyeonggi-do, South Korea

Yoon Won Lee

This inventor holds 1 USPTO granted patent. Top assignee: Skhynix Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoon Won Lee. Retrieved from https://idiyas.com/inventor/yoon-won-lee-4vebkybl

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Yoon Won Lee: Innovator in Data Storage Technology

Introduction

Yoon Won Lee is a prominent inventor based in Gyeonggi-do, South Korea. He has made significant contributions to the field of data storage technology. His innovative approach has led to the development of a unique storage device that enhances data migration processes.

Latest Patents

Yoon Won Lee holds a patent for a "Storage device that executes migrating data and operating method of the storage device." This invention allows a storage device to migrate valid data from one or more source data sections to destination data sections in response to external requests. The device also writes metadata for the migrated data, ensuring efficient data management.

Career Highlights

Yoon Won Lee is associated with SK Hynix Inc., a leading semiconductor manufacturer. His work at the company has been instrumental in advancing storage solutions that cater to modern data needs. With 1 patent to his name, he continues to push the boundaries of technology in the data storage sector.

Collaborations

Yoon collaborates with talented individuals such as Young Ho Ahn and Jae Youn Jang. Their combined expertise fosters an environment of innovation and creativity within their projects.

Conclusion

Yoon Won Lee's contributions to data storage technology exemplify the spirit of innovation. His patent reflects a commitment to improving data management processes, making a lasting impact in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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