Company Filing History:
Years Active: 2020-2022
Title: Yoon Taek Han: Innovator in Critical Dimension Measurement Systems
Introduction
Yoon Taek Han is a prominent inventor based in Hwaseong-si, South Korea. He has made significant contributions to the field of measurement systems, particularly in the area of critical dimension measurement. With a total of 2 patents, his work has garnered attention in the technology sector.
Latest Patents
Yoon Taek Han's latest patents include a critical dimension measurement system and a method of measuring critical dimensions using the same. This innovative system comprises a voltage measurement circuit, a control circuit, and a critical dimension measurement circuit. The voltage measurement circuit is designed to measure the potentials of mask patterns on a photomask. The control circuit features an information storage component that retains distribution information on the measured potentials and layout patterns corresponding to the mask patterns. The critical dimension measurement circuit can operate in two modes: a first measurement mode and a second, faster measurement mode, allowing for efficient measurement of critical dimensions.
Career Highlights
Yoon Taek Han is currently employed at Samsung Electronics Co., Ltd., where he continues to develop cutting-edge technologies. His expertise in measurement systems has positioned him as a valuable asset to the company.
Collaborations
He has collaborated with notable coworkers, including Won Joo Park and Hyung Joo Lee, contributing to advancements in their respective fields.
Conclusion
Yoon Taek Han's innovative work in critical dimension measurement systems exemplifies his commitment to advancing technology. His contributions are significant in the realm of measurement systems, and his patents reflect his expertise and dedication to innovation.