Daegu, South Korea

Yoon Ho Choi

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Seoul National University. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoon Ho Choi. Retrieved from https://idiyas.com/inventor/yoon-ho-choi-hpk8lba7

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Yoon Ho Choi: Innovator in High-Speed Pattern Matching Technology.

Introduction

Yoon Ho Choi is a notable inventor based in Daegu, South Korea. He has made significant contributions to the field of pattern matching technology. His innovative approach focuses on enhancing the speed and efficiency of character string pattern detection.

Latest Patents

Yoon Ho Choi holds a patent for a method of detecting character string patterns at high speed using layered shift tables. This method allows for the detection of at least one of N patterns in specific text by shifting a detection location across the text. The technique utilizes single-byte character-based layered SHIFT tables, which significantly increases the pattern matching speed compared to traditional algorithms. He has 1 patent to his name.

Career Highlights

Yoon Ho Choi is affiliated with Seoul National University, where he contributes to research and development in his field. His work has garnered attention for its practical applications in various technological domains.

Collaborations

Yoon Ho Choi collaborates with Seung Woo Seo, enhancing the research output and innovation potential in their projects.

Conclusion

Yoon Ho Choi's contributions to high-speed pattern matching technology exemplify the impact of innovative thinking in the field of computer science. His work continues to influence advancements in pattern detection methodologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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