Company Filing History:
Years Active: 2014-2023
Title: Yoomi Hur: Innovator in Microseismic Event Analysis
Introduction
Yoomi Hur is a prominent inventor based in Sunnyvale, California, known for her contributions to the field of microseismic event analysis. With a total of three patents to her name, she has made significant strides in understanding and improving the accuracy of microseismic event localization.
Latest Patents
Yoomi's latest patents include a "Method and system for microseismic event location error analysis and display." This invention addresses the challenges of microseismic event localization from a parameter estimation perspective. It encompasses a method and system for computing and displaying characteristics of event localization errors. Additionally, it includes techniques for deriving aggregate statistics from a set of event location estimates. These methods compute and display the probability that an event occurred in any given volume and describe the smallest volume that contains a specified percentage of the event probability.
Another notable patent is the "Method and apparatus for modeling microseismic event location estimate accuracy." This invention provides a framework for analytically studying microseismic source location estimation accuracy. It offers new geometric intuitions and quantitative relationships that enhance the understanding of this complex problem. These insights align with current observations in the state of the art.
Career Highlights
Throughout her career, Yoomi has worked with notable companies such as Seismic Innovations and Microsoft Technology Licensing, LLC. Her experience in these organizations has contributed to her expertise in microseismic event analysis and localization.
Collaborations
Yoomi has collaborated with esteemed colleagues, including Jonathan Stuart Abel and Sean A Coffin. These partnerships have further enriched her work and expanded the impact of her inventions.
Conclusion
Yoomi Hur stands out as an innovative force in the realm of microseismic event analysis. Her patents reflect her dedication to advancing the understanding of event localization and accuracy. Through her work, she continues to influence the field and inspire future innovations.