The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 17, 2018

Filed:

Aug. 29, 2012
Applicants:

Jonathan S. Abel, Menlo Park, CA (US);

Sean Coffin, Redwood City, CA (US);

Yoomi Hur, Sunnyvale, CA (US);

Inventors:

Jonathan S. Abel, Menlo Park, CA (US);

Sean Coffin, Redwood City, CA (US);

Yoomi Hur, Sunnyvale, CA (US);

Assignee:

SEISMIC INNOVATIONS, Menlo Park, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 1/34 (2006.01); G01V 1/28 (2006.01);
U.S. Cl.
CPC ...
G01V 1/288 (2013.01);
Abstract

The present invention relates generally to microseismic event analysis, and more particularly to a method and apparatus for modeling microseismic event location estimate accuracy. According to certain aspects, the present invention provides a framework for analytically studying microseismic source location estimation accuracy and further provides new geometric intuitions and quantitative relationships that aid in the understanding of this problem. These intuitions and expressions can be shown to be in agreement with current observations in the state of the art.


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