Seoul, South Korea

Yoo Sang Baek

This inventor holds 1 USPTO granted patent. Top assignee: Korea University Research and Business Foundation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoo Sang Baek. Retrieved from https://idiyas.com/inventor/yoo-sang-baek

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Yoo Sang Baek: Innovator in Thermal Imaging Diagnosis

Introduction

Yoo Sang Baek is a notable inventor based in Seoul, South Korea. He has made significant contributions to the field of medical diagnostics through his innovative work in thermal imaging technology. His research focuses on developing methods that enhance the accuracy of diagnosis results.

Latest Patents

Yoo Sang Baek holds 1 patent for a method and apparatus for determining diagnosis result data. This patent discloses a method that utilizes thermal images to assess skin temperature changes. The process involves acquiring thermal images after applying thermal and cold stimulation to the skin, extracting temperature restoration features, and determining diagnosis result data based on these features.

Career Highlights

Yoo Sang Baek is affiliated with the Korea University Research and Business Foundation, where he continues to advance his research in medical technology. His work has the potential to improve diagnostic procedures and patient outcomes in healthcare.

Collaborations

Yoo Sang Baek collaborates with Jae Young Kim, who is also involved in research and development in the same field. Their partnership enhances the innovative capabilities of their projects.

Conclusion

Yoo Sang Baek's contributions to thermal imaging and medical diagnostics exemplify the impact of innovation in healthcare. His work not only advances technology but also holds promise for improving patient care.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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