Yoo Jin Jeong

Title: Yoo Jin Jeong: Innovator in Wafer Inspection Technology

Introduction

Yoo Jin Jeong is a notable inventor based in Suwon-si, South Korea. He has made significant contributions to the field of semiconductor technology, particularly in the area of wafer inspection. His innovative approach has led to the development of advanced inspection devices that enhance the efficiency and accuracy of wafer analysis.

Latest Patents

Yoo Jin Jeong holds a patent for an "Inspection device for inspecting wafer and method of inspecting wafer using the same." This device comprises a first processor, a second processor, and a server. The first processor detects first coordinates of first feature points from first images in a first image set. The second processor detects second coordinates of second feature points from second images in a second image set. The server generates reference coordinates based on the first coordinates and the second coordinates. These reference coordinates are then transmitted to both processors. The first and second image sets correspond to scanned swaths on a wafer. This patent showcases his expertise in developing technologies that improve semiconductor manufacturing processes.

Career Highlights

Yoo Jin Jeong is currently employed at Samsung Electronics Co., Ltd., a leading global technology company. His work at Samsung has allowed him to collaborate with some of the brightest minds in the industry, contributing to groundbreaking advancements in technology.

Collaborations

Some of his notable coworkers include Janghee Lee and Sangbong Park. Their collaborative efforts have played a crucial role in the development of innovative solutions within the company.

Conclusion

Yoo Jin Jeong's contributions to wafer inspection technology exemplify his commitment to innovation in the semiconductor industry. His patent and work at Samsung Electronics Co., Ltd. highlight his role as a key player in advancing technology.