Yongmin Liu

Title: Yongmin Liu - Innovator in Helium Mass Spectrometric Testing

Introduction

Yongmin Liu is a distinguished inventor based in Beijing, China. He has made significant contributions to the field of helium mass spectrometric testing. His innovative methods have advanced the understanding and application of fine-leak testing in electronic components.

Latest Patents

Yongmin Liu holds a patent titled "Method for helium mass spectrometric fine-leak test based on quantitative determination of maximum test-waiting time." This method provides a quantitative approach to determining the maximum test-waiting time during helium mass spectrometric tests. It establishes a criterion for measuring leak rates based on the minimum helium gas exchange time constant of an acceptable sealed electronic component. This innovative method allows for a more accurate determination of maximum test-waiting times, which can exceed one hour, contrary to existing standards.

Career Highlights

Yongmin Liu is currently employed at Beijing Keyton Electronic Relay Corporation Ltd. His work focuses on enhancing the reliability and efficiency of electronic components through advanced testing methods. His expertise in helium mass spectrometric testing has positioned him as a key figure in his field.

Collaborations

Yongmin Liu has collaborated with notable colleagues, including Genglin Wang and Fei Fei Li. These collaborations have fostered a productive environment for innovation and development in their respective projects.

Conclusion

Yongmin Liu's contributions to helium mass spectrometric testing exemplify the impact of innovative thinking in technology. His patent and work at Beijing Keyton Electronic Relay Corporation Ltd. highlight his commitment to advancing electronic component testing methods.