This inventor holds 1 USPTO granted patent. Top assignee: National Central University. Active years: 2019.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2019
Title: Yong-Xiao Chen: Innovator in Delay Measurement Technology
Introduction
Yong-Xiao Chen is a notable inventor based in Taipei, Taiwan. He has made significant contributions to the field of delay measurement technology. His innovative work has led to the development of a unique patent that enhances the accuracy of delay measurements in various applications.
Latest Patents
Yong-Xiao Chen holds a patent for a "Delay measurement circuit and measuring method thereof." This invention includes a delay measurement circuit that comprises a transporting path selector, first and second delay measurement devices, and a controller. The circuit forms multiple transporting loops through two reference conductive wires and a tested conductive wire based on a control signal. The first delay measurement device measures parts of the transporting loops to obtain a series of first transporting delays. Similarly, the second delay measurement device measures parts of the loops to acquire a series of second transporting delays. The controller generates the control signal and determines the transporting delay of the tested conductive wire using the first and second transporting delays.
Career Highlights
Yong-Xiao Chen is affiliated with National Central University, where he continues to engage in research and development. His work is characterized by a commitment to advancing measurement technologies and contributing to academic knowledge in his field.
Collaborations
Yong-Xiao Chen has collaborated with esteemed colleagues such as Jin-Fu Li and Han-Yu Wu. Their joint efforts have furthered the research and development of innovative technologies in delay measurement.
Conclusion
Yong-Xiao Chen's contributions to delay measurement technology exemplify his dedication to innovation and research. His patent reflects a significant advancement in the field, showcasing his expertise and commitment to enhancing measurement accuracy.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
