Icheon, South Korea

Yong Sun Kim

This inventor holds 2 USPTO granted patents and 14 published patent applications. Top assignee: Skhynix Inc.. Active years: 2024-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yong Sun Kim. Retrieved from https://idiyas.com/inventor/yong-sun-kim-obac7efh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 2 

% Patents Active = 50.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2024-2026

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2 patents (USPTO):Explore Patents

Title: Yong Sun Kim: Innovator in Memory Device Technology

Introduction

Yong Sun Kim is a notable inventor based in Icheon-si, South Korea. He has made significant contributions to the field of memory devices, showcasing his expertise through innovative patents.

Latest Patents

One of his key patents is titled "Memory device performing repair operation." This invention includes a fail test circuit that generates a fail flag to indicate whether a failure was detected in a column line. The fail flag is based on internal data outputted from the selected column line during testing. Additionally, the memory device features a repair information generation circuit that creates a repair column address for fixing the column line based on the fail flag.

Career Highlights

Yong Sun Kim is currently employed at SK Hynix Inc., a leading semiconductor manufacturer. His work at the company has allowed him to focus on advancing memory technology and improving device reliability.

Collaborations

Yong Sun Kim collaborates with Mi Hyun Hwang, a talented coworker who contributes to their shared projects in memory device innovation.

Conclusion

Yong Sun Kim's contributions to memory device technology through his patent demonstrate his commitment to innovation in the field. His work continues to influence advancements in semiconductor technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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