This inventor holds 1 USPTO granted patent. Top assignee: Korea Research Institute of Standards and Science. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: Yong-sik Ghim: Innovator in Vibration Insensitive Interferometry
Introduction
Yong-sik Ghim is a notable inventor based in Sejong-Si, South Korea. He has made significant contributions to the field of interferometry, particularly in the measurement of multilayer thin films. His innovative approach has led to advancements that enhance the accuracy and reliability of measurements in various applications.
Latest Patents
Yong-sik Ghim holds a patent for "Vibration Insensitive Interferometry for Measuring Thickness and Profile of Multilayer Thin-Film." This patent describes an apparatus and method that utilize a vibration insensitive interference technique to measure the thickness and profile of multilayer thin films. The method involves acquiring multiple phase-shifted interference signal images simultaneously through interference signals between a reference flat and the measurement object. This is achieved using a polarizing beam splitter, a quarter-wave plate, a shutter, and a pixelated polarizing camera. Additionally, the invention allows for the measurement of reflectance by obtaining reflected signal images through various polarizers.
Career Highlights
Yong-sik Ghim is affiliated with the Korea Research Institute of Standards and Science, where he continues to work on innovative projects. His expertise in interferometry has positioned him as a key figure in advancing measurement technologies. He has successfully developed methods that improve the precision of measurements in scientific research and industrial applications.
Collaborations
Yong-sik Ghim collaborates with esteemed colleagues such as Yong-bum Seo and Hyug-gyo Rhee. Their combined efforts contribute to the ongoing research and development in the field of standards and measurement science.
Conclusion
Yong-sik Ghim's contributions to vibration insensitive interferometry exemplify the impact of innovative thinking in scientific measurement. His work not only enhances the accuracy of multilayer thin film measurements but also sets a foundation for future advancements in the field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile