Yongin, South Korea

Yong-ik Sung

This inventor holds 1 USPTO granted patent. Top assignee: Nvisana Co., Ltd.. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yong-ik Sung. Retrieved from https://idiyas.com/inventor/yong-ik-sung

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Yong-ik Sung: Innovator in Analyte Sampling Technology

Introduction

Yong-ik Sung is a notable inventor based in Yongin-si, South Korea. He has made significant contributions to the field of analyte sampling technology. His innovative work has led to the development of a unique apparatus that enhances the efficiency of analyte sampling processes.

Latest Patents

Yong-ik Sung holds a patent for an "Apparatus for analyte sampling, method of analyte sampling and analyte sampling analysis system." This invention discloses an apparatus that includes a spray unit designed to mix and spray an analyte sample with a trapping solution in an aerosol state. The system features a spray chamber for primary trapping of analyte materials, a trapping tube for secondary trapping, and a trapping container to collect the trapped analyte material. Additionally, a sample transfer unit is included to facilitate the transfer of the trapping solution to an analysis unit using purge gas. Yong-ik Sung has 1 patent to his name.

Career Highlights

Yong-ik Sung is associated with Nvisana Co., Ltd., where he continues to work on advancements in analyte sampling technologies. His expertise and innovative approach have positioned him as a key figure in his field.

Collaborations

Yong-ik Sung collaborates with Pil-kwon Jun, contributing to the development of cutting-edge technologies in analyte sampling.

Conclusion

Yong-ik Sung's contributions to analyte sampling technology demonstrate his commitment to innovation and excellence. His work continues to influence the field and pave the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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