Suwon, South Korea

Yong Hyun Lim

This inventor holds 3 USPTO granted patents and 1 EPO patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yong Hyun Lim. Retrieved from https://idiyas.com/inventor/yong-hyun-lim-14bfkrfh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0


Average Co-Inventor Count = 7.7

ph-index = 2

Forward Citations = 18(Granted Patents)


Company Filing History:


Years Active: 2016

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3 patents (USPTO):Explore Patents

Title: Yong Hyun Lim: Innovator in Brain Wave Measurement Technology

Introduction

Yong Hyun Lim is a prominent inventor based in Suwon-si, South Korea. He has made significant contributions to the field of technology, particularly in the area of brain wave measurement. With a total of 3 patents to his name, Lim is recognized for his innovative approach to developing advanced devices.

Latest Patents

One of Yong Hyun Lim's latest patents is a headset designed for measuring brain waves. This innovative device aims to enhance the understanding of brain activity and has potential applications in various fields, including healthcare and cognitive research.

Career Highlights

Lim is currently employed at Samsung Electronics Co., Ltd., a leading global technology company. His work at Samsung has allowed him to collaborate with other talented professionals and contribute to groundbreaking projects in the tech industry.

Collaborations

Throughout his career, Yong Hyun Lim has worked alongside notable colleagues, including Hee Jae Jo and Se Hoon Lim. These collaborations have fostered a creative environment that encourages innovation and the development of new technologies.

Conclusion

Yong Hyun Lim's contributions to brain wave measurement technology exemplify his dedication to innovation. His work continues to influence the tech industry and pave the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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