Yong-hwan Cho

Title: **Innovator Yong-hwan Cho: Advancing Parallel Bit Testing Technology**

Introduction

Yong-hwan Cho is an accomplished inventor based in Cheonan-si, South Korea, known for his contribution to memory chip technology. With one patented invention to his name, he has made a significant impact in the field of electronic testing systems, particularly through innovations that aim to enhance efficiency and reduce testing time.

Latest Patents

Yong-hwan Cho's notable patent is titled "Parallel bit test apparatus and parallel bit test method capable of reducing test time." This innovative parallel bit test (PBT) apparatus is designed for memory chips that are configured in a multi-chip package (MCP) and utilize shared data signal lines. The invention includes a comparing unit that outputs data signals representing the comparison between test data signals supplied to a designated memory chip and the corresponding output data signals. Furthermore, a coding unit plays a crucial role in this apparatus, as it produces representative data signals using a selected subset of shared data signal lines. This exclusive selection process ensures the first subset does not overlap with the other subsets utilized by coding units of other memory chips, thus optimizing test efficiency.

Career Highlights

Yong-hwan Cho is affiliated with Samsung Electronics Co., Ltd., a leading global technology firm renowned for its groundbreaking innovations in electronic products. His role within the company exemplifies his commitment to advancing technology, particularly in memory solutions and testing methodologies.

Collaborations

Throughout his career, Yong-hwan Cho has worked alongside distinguished colleagues, including Kwun-soo Cheon and Hyun-Soon Jang. These collaborations have enabled a vibrant exchange of ideas and expertise, contributing to the successful development and implementation of sophisticated testing technologies.

Conclusion

Yong-hwan Cho's patent and collaborative efforts highlight his dedication to innovation in the field of electronic testing. His work not only represents a significant advancement in technology but also showcases the collaborative spirit that drives progress in the industry. As he continues his work at Samsung Electronics, the potential for further contributions to electronic innovation remains promising, setting a benchmark for aspiring inventors in the field.