The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2011
Filed:
Jan. 03, 2008
Yong-hwan Cho, Cheonan-si, KR;
Kwun-soo Cheon, Suwon-si, KR;
Hyun-soon Jang, Seoul, KR;
Seung-whan Seo, Cheonan-si, KR;
Yong-hwan Cho, Cheonan-si, KR;
Kwun-soo Cheon, Suwon-si, KR;
Hyun-soon Jang, Seoul, KR;
Seung-whan Seo, Cheonan-si, KR;
Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;
Abstract
A parallel bit test (PBT) apparatus, included in memory chips that are stacked in a multi-chip package (MCP) and that share a set of data signal lines, may include: a comparing unit to output a data signal representative of a comparison between test data signals provided to a given one of the memory chips and corresponding data signals output therefrom, respectively; and a coding unit to output the representative data signal using a first subset of the shared set of data signal lines, the first subset not overlapping other subsets used by coding units corresponding to the other ones of the memory chips, respectively, the coding unit selecting one or more of the data signal lines amongst the shared set of data signal lines for inclusion in the first subset according to a first test mode register set (MRS) signal.