This inventor holds 1 USPTO granted patent. Top assignee: Mitsubishi Denki Kabushiki Kaisha. Active years: 1990.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1990
Title: Yoko Yamamoto: Innovator in Defect Detection Technology
Introduction
Yoko Yamamoto is a prominent inventor based in Hyogo, Japan. She has made significant contributions to the field of semiconductor technology, particularly in the area of defect detection systems. Her innovative approach has led to the development of a unique patent that enhances the reliability of integrated circuits.
Latest Patents
Yoko Yamamoto holds a patent for a "System for detecting defects in a regularly arranged pattern." This patent describes a pattern defect detecting system for integrated semiconductor circuits. The system utilizes the phenomenon that, in the case of a test pattern with regularity, the intensity of diffracted light on a back-focal plane of a lens is high. In contrast, defects or foreign matters lacking regularity exhibit lower intensity of diffracted light. A concrete example of her invention involves the use of an optical space modulator to record only the intense light portions in real time. The recorded diffraction pattern can be easily erased through the application of voltage and light radiation. This allows for the preparation of a spatial filter in real time, corresponding directly to the test sample. Furthermore, even with changes in the test pattern, immediate actions can be taken for continuous defect detection, enabling on-line testing.
Career Highlights
Yoko Yamamoto is associated with Mitsubishi Denki Kabushiki Kaisha, a leading company in the technology sector. Her work has been instrumental in advancing the capabilities of defect detection in semiconductor manufacturing. With her innovative solutions, she has contributed to improving the quality and efficiency of electronic devices.
Collaborations
Yoko has collaborated with notable colleagues, including Hitoshi Tanaka and Noboru Mikami. Their combined expertise has fostered a productive environment for innovation and development in their field.
Conclusion
Yoko Yamamoto's contributions to defect detection technology exemplify her commitment to innovation in the semiconductor industry. Her patent reflects a significant advancement that enhances the reliability of integrated circuits. Through her work at Mitsubishi Denki Kabushiki Kaisha, she continues to influence the future of technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
