Company Filing History:
Years Active: 1999-2000
Title: The Innovative Contributions of Yoko Irie
Introduction
Yoko Irie, an accomplished inventor based in Kawasaki, Japan, is known for her groundbreaking work in the field of inspection technologies. With a total of two patents to her name, she has made significant advancements that aid in the detection of defects in complex wiring patterns. Her innovative approaches have transformed inspection processes and enhanced the reliability of circuit boards and other electronic components.
Latest Patents
Yoko Irie's latest patents include:
1. **Method and Device of Inspecting Three-Dimensional Shape Defect**: This invention presents a method for detecting three-dimensional shape defects by selecting a detection region based on a two-dimensional optical picture fluorescence emitted from a detection object. The process involves a series of steps that allow for the detection of defects caused by deficiencies in thickness within wiring patterns on circuit boards. The efficiency of this method enables the detection of shape defects in a short period of time.
2. **Wiring Pattern Inspecting Method and System for Carrying Out the Same**: This patent describes a system for inspecting circuitry by utilizing x-rays to assess the thickness of superposed wiring patterns across multiple layers. The method focuses on obtaining variable-density image signals and extracting relevant information to identify defects within the wiring. This process enhances the ability to inspect complex wiring structures effectively.
Career Highlights
Yoko Irie is currently associated with Hitachi, Ltd., a prominent company known for its technological innovations. Her work has positioned her as a key contributor to advancements in inspection technologies within the electronics sector. Throughout her career, Yoko has shown a remarkable ability to blend theoretical knowledge with practical applications, resulting in impactful inventions that improve the quality of electronic products.
Collaborations
In her journey as an inventor, Yoko Irie has collaborated with esteemed colleagues, including Hideaki Doi and Hiroya Koshishiba. These collaborations have fostered an exchange of ideas and have led to the growth of innovative solutions in their respective fields. Working alongside talented professionals has enriched Yoko's experience and contributed to her successful patent portfolio.
Conclusion
Yoko Irie's contributions to the field of inspection technology are noteworthy and demonstrate her dedication to advancing innovation. Her patents reflect a deep understanding of the complexities involved in electronic product design and inspection. As technology continues to evolve, Yoko's work will undoubtedly play a crucial role in ensuring the reliability and integrity of electronic devices, solidifying her status as a pioneering inventor in her field.