Pully, Switzerland

Yok-Ai Que

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: The General Hospital Corporation. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yok-Ai Que. Retrieved from https://idiyas.com/inventor/yok-ai-que

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Innovations by Yok-Ai Que in Infection Treatment

Introduction

Yok-Ai Que is an innovative inventor based in Pully, Switzerland. He has made significant contributions to the field of medical technology, particularly in the diagnosis and treatment of infections. His work is especially relevant for patients recovering from burn injuries.

Latest Patents

Yok-Ai Que holds a patent for "Methods and assays relating to the treatment of infection." This technology focuses on improving the diagnosis, prognosis, and treatment of infections, which is crucial for enhancing patient outcomes after burn injuries. He has 1 patent to his name.

Career Highlights

Yok-Ai Que is affiliated with The General Hospital Corporation, where he applies his expertise in medical research and innovation. His work has the potential to transform how infections are treated, particularly in vulnerable patient populations.

Collaborations

Yok-Ai Que collaborates with esteemed colleagues, including Laurence G Rahme and Shuangchun Yan, who contribute to his research efforts and enhance the impact of his innovations.

Conclusion

Yok-Ai Que's contributions to infection treatment demonstrate the importance of innovation in healthcare. His work not only addresses critical medical challenges but also paves the way for future advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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