This inventor holds 1 USPTO granted patent. Top assignee: Osaka University. Active years: 2006.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2006
Title: The Innovative Contributions of Yoicho Otsuka
Introduction
Yoicho Otsuka is a notable inventor based in Ikeda, Japan. He has made significant contributions to the field of nanotechnology through his innovative patent. His work focuses on measuring and evaluating local electrical characteristics of samples with nano-scale structures.
Latest Patents
Otsuka holds a patent for a "Method and apparatus for measuring and evaluating local electrical characteristics of a sample having a nano-scale structure." This invention features a probe device that includes a cantilever. The probe is designed to be opposed to the surface of a sample, allowing for precise measurements. The apparatus can switch between two operating modes: a tapping mode for measuring surface structure while vibrating the cantilever, and a point contact mode for assessing the electrical characteristics by bringing the probe into contact with the sample.
Career Highlights
Otsuka is affiliated with Osaka University, where he continues to advance research in his field. His work has garnered attention for its potential applications in various technological advancements.
Collaborations
He has collaborated with notable colleagues, including Takuya Matsumoto and Yasuhisa Naitoh, contributing to the development of innovative solutions in nanotechnology.
Conclusion
Yoicho Otsuka's contributions to the field of nanotechnology through his patent demonstrate his commitment to advancing scientific knowledge and innovation. His work continues to inspire future research and development in this critical area.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile