The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2006
Filed:
Feb. 25, 2005
Takuya Matsumoto, Kyoto, JP;
Yoicho Otsuka, Ikeda, JP;
Yasuhisa Naitoh, Tsukuba, JP;
Tomoji Kawai, Mino, JP;
Takuya Matsumoto, Kyoto, JP;
Yoicho Otsuka, Ikeda, JP;
Yasuhisa Naitoh, Tsukuba, JP;
Tomoji Kawai, Mino, JP;
Osaka University, Suita, JP;
Abstract
A probe device including a cantilever. A probe is attached to the cantilever and is allocated to be opposed to a surface of a sample attached thereto. An apparatus is provided with the probe device, which is capable of carrying out measurement of the sample while switching at a predetermined period two operating modes, a tapping mode for measuring a surface structure of the sample while vibrating the cantilever and a point contact mode for measuring an electrical characteristic of the sample while bringing the probe into contact with the sample.