Hachioji, Japan

Yoichiro Yamada

This inventor holds 1 USPTO granted patent. Top assignee: Hewlett-Packard Company. Active years: 1994.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoichiro Yamada. Retrieved from https://idiyas.com/inventor/yoichiro-yamada-wcgyjgnn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 26(Granted Patents)


Company Filing History:


Years Active: 1994

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1 patent (USPTO):Explore Patents

Title: Yoichiro Yamada: Innovator in Electronic Device Testing

Introduction

Yoichiro Yamada is a notable inventor based in Hachioji, Japan. He has made significant contributions to the field of electronic device testing, particularly through his innovative patent. His work is recognized for enhancing the efficiency and accuracy of testing mixed signal electronic devices.

Latest Patents

Yamada holds a patent for an "Apparatus and method for testing electronic devices." This invention focuses on testing mixed signal electronic devices, which include devices like LSI that handle various input/output signals, such as direct current, digital, and analog signals. The apparatus comprises a master clock subsystem, a digital master subsystem, a digital slave subsystem, a waveform generator subsystem, a waveform digitizer subsystem, a time measuring module, and a direct current subsystem. The system is designed to synchronize with the master clock from the device under test, ensuring precise timing and functionality.

Career Highlights

Yamada is currently associated with Hewlett-Packard Company, where he continues to innovate in the field of electronic testing. His expertise and contributions have positioned him as a valuable asset in the industry.

Collaborations

Yamada has worked alongside notable colleagues, including Jun Kurita and Kiyoyasu Hiwada. Their collaborative efforts have further advanced the development of testing technologies.

Conclusion

Yoichiro Yamada's contributions to electronic device testing through his innovative patent demonstrate his commitment to advancing technology in this field. His work continues to influence the industry and improve testing methodologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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