Yamanashi-ken, Japan

Yoichiro Shimura


Average Co-Inventor Count = 4.9

ph-index = 1

Forward Citations = 6(Granted Patents)


Location History:

  • Kofu, JP (2003)
  • Yamanashi-ken, JP (2007 - 2009)

Company Filing History:


Years Active: 2003-2009

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3 patents (USPTO):Explore Patents

Title: The Innovations of Yoichiro Shimura

Introduction

Yoichiro Shimura is a notable inventor based in Yamanashi-ken, Japan. He has made significant contributions to the field of semiconductor technology, particularly in the development of X-ray and radiation detectors. With a total of 3 patents to his name, Shimura's work has advanced the capabilities of detection technologies.

Latest Patents

One of Shimura's latest patents is an X-ray detector designed to detect X-rays using a semiconductor that generates electric charges upon X-ray incidence. This detector features electrodes formed on opposite sides of the semiconductor, which is made of amorphous selenium (a-Se) doped with an alkali metal. Another significant patent is for a radiation detector that utilizes a common electrode for bias voltage application on the surface of an amorphous selenium semiconductor film. This common electrode is a gold thin film, which is applied at a low vapor deposition temperature, minimizing defects in the semiconductor film and enhancing bonding properties.

Career Highlights

Throughout his career, Yoichiro Shimura has worked with prominent companies such as Shimadzu Corporation and Shindengen Electric Manufacturing Company Limited. His experience in these organizations has contributed to his expertise in semiconductor technologies and innovation.

Collaborations

Shimura has collaborated with notable coworkers, including Kenji Sato and Kazuhiko Shima. Their combined efforts have fostered advancements in the field of detection technologies.

Conclusion

Yoichiro Shimura's contributions to the field of semiconductor technology, particularly through his innovative patents, have made a lasting impact. His work continues to influence the development of advanced detection systems.

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