Company Filing History:
2 out of 21,351 
2 out of 52 Years Active: 1998-1999
Title: Yohji Mashiko: Innovator in Semiconductor Failure Analysis
Introduction
Yohji Mashiko is a prominent inventor based in Hyogo, Japan. He has made significant contributions to the field of semiconductor technology, particularly in analyzing failures in semiconductor wafers. With a total of 2 patents, his work has advanced the understanding and resolution of defects in semiconductor manufacturing.
Latest Patents
Mashiko's latest patents focus on systems and methods for analyzing failures in semiconductor wafers. One of his patents describes a system that calculates defect position coordinates obtained from physical inspections. This system improves the accuracy of failure analysis by collating data from various sources, including fail bit data from testers and defect inspecting apparatuses. The method enhances the ability to identify additional failure regions, thereby allowing for a more comprehensive understanding of semiconductor defects.
Another patent outlines an apparatus for analyzing failures in semiconductor wafers. This invention also emphasizes the importance of storing and collating data from multiple sources to improve the accuracy of failure analysis. By integrating data from defect inspections and fail bit analyses, Mashiko's inventions provide a robust framework for identifying and addressing semiconductor failures.
Career Highlights
Throughout his career, Yohji Mashiko has worked with notable companies in the semiconductor industry. He has been associated with Mitsubishi Electric Corporation and Ryoden Semiconductor System Engineering Corporation. His experience in these organizations has contributed to his expertise in semiconductor technology and failure analysis.
Collaborations
Mashiko has collaborated with esteemed colleagues, including Toshikazu Tsutsui and Tohru Koyama. These partnerships have fostered innovation and have played a crucial role in the development of his patented technologies.
Conclusion
Yohji Mashiko's contributions to semiconductor failure analysis through his patents and career experiences have significantly impacted the industry. His innovative approaches continue to enhance the accuracy and efficiency of semiconductor manufacturing processes.