Company Filing History:
Years Active: 2013
Title: Yohei Shintaku: Innovator in Imaging Technology
Introduction
Yohei Shintaku is a notable inventor based in Sendai, Japan. He has made significant contributions to the field of imaging technology, particularly in the detection of structural defects and lesions. His innovative work has led to the development of a unique imaging method that enhances the accuracy of defect detection.
Latest Patents
Yohei Shintaku holds 1 patent for his invention titled "Imaging method of structure defect, imaging device of structure defect, imaging method of bubble or lesion and imaging device of bubble or lesion." This patent describes a method where scattered waves from defects of burst ultrasonic waves are received by an array receiver. The reception signal is processed through a band-pass filter, allowing for the extraction of specific frequency components. This process ultimately leads to the generation of images that accurately depict structural defects.
Career Highlights
Shintaku is affiliated with Tohoku University, where he continues to advance his research in imaging technology. His work has garnered attention for its practical applications in various fields, including engineering and medical diagnostics.
Collaborations
He has collaborated with notable colleagues such as Kazushi Yamanaka and Yoshikazu Ohara, contributing to the advancement of imaging techniques and methodologies.
Conclusion
Yohei Shintaku's innovative contributions to imaging technology demonstrate his commitment to enhancing defect detection methods. His work continues to influence the field and pave the way for future advancements.