The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2013

Filed:

May. 19, 2009
Applicants:

Kazushi Yamanaka, Sendai, JP;

Yoshikazu Ohara, Sendai, JP;

Yohei Shintaku, Sendai, JP;

Inventors:

Kazushi Yamanaka, Sendai, JP;

Yoshikazu Ohara, Sendai, JP;

Yohei Shintaku, Sendai, JP;

Assignee:

Tohoku University, Sendai-Shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01N 29/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

Scattered waves from the defect of burst ultrasonic waves radiated from an ultrasonic transmitter to a structure in two different arrangements of the ultrasonic transmitter and an array receiver are received by the array receiver so as to obtain a reception signal. The reception signal is subjected to a band-pass filter that passes a specific frequency component, shifted by different time according to the position of each reception sensor element of the array receiver and then, added so as to obtain a processing signal. On the basis of the processing signal, an image of the defect is obtained, respectively. A common portion of the obtained two images is extracted.


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