Tokyo, Japan

Yohei Noshiro

This inventor holds 2 USPTO granted patents. Top assignees: Fuji Jukogyo Kabushiki Kaisha, Nissan Motor Company Limited. Active years: 2015-2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yohei Noshiro. Retrieved from https://idiyas.com/inventor/yohei-noshiro

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.4

ph-index = 2

Forward Citations = 34(Granted Patents)


Company Filing History:


Years Active: 2015-2022

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2 patents (USPTO):Explore Patents

Title: Yohei Noshiro: Innovator in Automotive Instrumentation

Introduction

Yohei Noshiro is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of automotive instrumentation, holding a total of 2 patents. His work has been instrumental in enhancing the functionality and design of instrument panels in automobiles.

Latest Patents

Among his latest innovations, Noshiro has developed an advanced instrument panel for automobiles. This invention showcases his commitment to improving user experience and safety in vehicle design.

Career Highlights

Noshiro has had a distinguished career, working with notable companies such as Nissan Motor Company Limited and Fuji Jukogyo Kabushiki Kaisha. His experience in these leading automotive firms has allowed him to refine his skills and contribute to groundbreaking projects.

Collaborations

Throughout his career, Noshiro has collaborated with talented individuals, including Masahiro Matsuda and Daisuke Miyashita. These partnerships have fostered a creative environment that has led to innovative solutions in automotive technology.

Conclusion

Yohei Noshiro's contributions to the automotive industry through his patents and collaborations highlight his role as a key innovator. His work continues to influence the design and functionality of instrument panels in modern vehicles.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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