Herzliya, Israel

Yohanan Davidovich

This inventor holds 1 USPTO granted patent. Top assignees: Hillberry Gat Ltd., Tower Semiconductor Ltd.. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yohanan Davidovich. Retrieved from https://idiyas.com/inventor/yohanan-davidovich

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: The Innovations of Yohanan Davidovich

Introduction

Yohanan Davidovich is a notable inventor based in Herzliya, Israel. He has made significant contributions to the field of image sensor technology. His work has led to the development of innovative solutions that enhance the functionality of image sensors.

Latest Patents

Davidovich holds a patent for an image sensor module and a method for evaluating an image sensor. This patent describes an image sensor module that comprises a die, which includes light sensors and optics. The optics feature luminescent elements that represent die manufacturing information, indicative of the manufacturing process of the die. He has 1 patent to his name.

Career Highlights

Throughout his career, Davidovich has worked with prominent companies in the semiconductor industry. Notably, he has been associated with Tower Semiconductor Ltd. and Hillberry Gat Ltd. His experience in these organizations has allowed him to refine his skills and contribute to groundbreaking technologies.

Collaborations

Davidovich has collaborated with several talented individuals in his field. Among his notable coworkers are Yakov Roizin and Viktor Goldovsky. Their collective expertise has fostered an environment of innovation and creativity.

Conclusion

Yohanan Davidovich's contributions to image sensor technology exemplify the spirit of innovation. His patent and collaborations reflect his commitment to advancing the field. His work continues to influence the development of new technologies in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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