Yoel Ilssar

Title: Yoel Ilssar - Innovator in Wafer Inspection Technology

Introduction

Yoel Ilssar is a notable inventor based in Haifa, Israel. He has made significant contributions to the field of micro-electronics through his innovative designs and patents. His work primarily focuses on improving the efficiency and accuracy of wafer inspection systems.

Latest Patents

Ilssar holds a patent for a wafer inspection system. This system is designed for the semiautomatic inspection of printed circuits on silicon wafers and similar micro-electronic products. It features a floating table that supports a robot arm capable of grabbing a single wafer from a cassette, inverting it, and moving it in the Y-axis direction for inspection. The system also includes an optical inspection device, such as an optical microscope combined with a TV camera, which is adapted to move along the X-coordinate of the inspection system. A sophisticated optoscanner system is utilized for aligning the wafer and establishing its exact position. The wafer is held by a vacuum gripper from the moment it is removed from the first cassette until it is inserted into another one.

Career Highlights

Ilssar is currently employed at Galai Laboratories Ltd., where he continues to develop and refine his innovative technologies. His work has been instrumental in advancing the capabilities of wafer inspection systems, making them more efficient and reliable.

Collaborations

Ilssar collaborates with Nir Karasikov, who is also involved in the development of technologies at Galai Laboratories Ltd. Their partnership has contributed to the success of various projects within the company.

Conclusion

Yoel Ilssar's contributions to wafer inspection technology highlight his innovative spirit and dedication to advancing the field of micro-electronics. His patent for a wafer inspection system exemplifies the importance of precision and efficiency in modern manufacturing processes.