Johor Bahru, Malaysia

Yock-Tee Goo

This inventor holds 1 USPTO granted patent. Top assignee: Proview Electronics (Taiwan) Co., Ltd.. Active years: 2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yock-Tee Goo. Retrieved from https://idiyas.com/inventor/yock-tee-goo-4baxja6d

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: Yock-Tee Goo: Innovator in Computer Monitor Technology

Introduction

Yock-Tee Goo is a notable inventor based in Johor Bahru, Malaysia. He has made significant contributions to the field of technology, particularly in the development of computer monitors. His innovative work has led to the granting of a patent, showcasing his expertise and creativity in the industry.

Latest Patents

Yock-Tee Goo holds a patent for a computer monitor, which reflects his commitment to enhancing visual technology. This patent is a testament to his ability to create solutions that meet the evolving needs of consumers and businesses alike. He has 1 patent to his name, highlighting his contributions to the field.

Career Highlights

Throughout his career, Yock-Tee Goo has worked with Proview Electronics (Taiwan) Co., Ltd., a company known for its advancements in display technology. His role at Proview has allowed him to collaborate with other professionals in the industry, furthering his impact on computer monitor innovation.

Collaborations

Due to space constraints, the details of Yock-Tee Goo's collaborations will not be included.

Conclusion

Yock-Tee Goo is a distinguished inventor whose work in computer monitor technology has made a lasting impact. His patent and career at Proview Electronics demonstrate his dedication to innovation in the tech industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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