Tochigi, Japan

Yo Terashita

USPTO Granted Patents = 5 

 

Average Co-Inventor Count = 2.8

ph-index = 1

Forward Citations = 2(Granted Patents)


Location History:

  • Utsunomiya, JP (2014)
  • Tochigi, JP (2017 - 2022)
  • Tochigi prefecture, JP (2023)

Company Filing History:


Years Active: 2014-2025

Loading Chart...
Loading Chart...
5 patents (USPTO):Explore Patents

Title: Innovations by Yo Terashita

Introduction

Yo Terashita is a notable inventor based in Tochigi, Japan. He has made significant contributions to the field of measurement technology, holding a total of 5 patents. His work primarily focuses on developing advanced systems for determining abnormalities in measuring apparatuses.

Latest Patents

Among his latest patents are the "Abnormality determination apparatus," "abnormality determination method," and "abnormality determination system." The abnormality determination apparatus features a data acquisition part that collects position data from a standard gage used in a coordinate measuring apparatus. This system is designed to identify any abnormalities in the measuring apparatus by comparing the measured distances against an appropriate range. Another significant patent is the "Control method of shape measuring apparatus," which involves a main reference point and a series of steps to ensure accurate measurements and calibrations of the rotary table.

Career Highlights

Yo Terashita is currently employed at Mitutoyo Corporation, a leading company in precision measurement technology. His innovative work has contributed to enhancing the accuracy and reliability of measurement systems, making a substantial impact in the industry.

Collaborations

He has collaborated with notable coworkers, including Hiroshi Kamitani and Tomohiro Usui, who share a commitment to advancing measurement technologies.

Conclusion

Yo Terashita's contributions to measurement technology through his patents and work at Mitutoyo Corporation highlight his role as a significant inventor in the field. His innovations continue to influence the accuracy and efficiency of measuring systems.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…