Yo-han Choi

Title: Innovations of Yo-han Choi

Introduction

Yo-han Choi is a prominent inventor based in Gyeonggi-do, South Korea. He has made significant contributions to the field of technology, particularly in the area of photomask correction and critical dimension measurement. With a total of 4 patents to his name, Choi continues to push the boundaries of innovation.

Latest Patents

Choi's latest patents include methods for measuring mean-to-target (MTT) based on pattern area measurements. This innovative approach involves providing a design pattern and measuring a plurality of design pattern measurements to calculate the area based on the shape of the design pattern. The process generates a database that aids in selecting calculation measurements corresponding to actual patterns. Additionally, he has developed methods of measuring critical dimensions, which involve forming object patterns and reference patterns on a substrate. By comparing the optical properties of these patterns, Choi can determine the critical dimensions accurately.

Career Highlights

Choi is currently employed at Samsung Electronics Co., Ltd., where he applies his expertise in developing advanced measurement techniques. His work has been instrumental in enhancing the precision of photomasks and critical dimension measurements, which are vital in semiconductor manufacturing.

Collaborations

Choi collaborates with talented coworkers, including Hyung-joo Lee and Jin-Min Kim, who contribute to the innovative projects at Samsung Electronics. Their teamwork fosters a creative environment that leads to groundbreaking advancements in technology.

Conclusion

Yo-han Choi's contributions to the field of technology through his patents and collaborative efforts at Samsung Electronics Co., Ltd. highlight his role as a key innovator. His work continues to influence the industry and pave the way for future advancements.