East Newark, NJ, United States of America

Yiyi Li

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Navac Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yiyi Li. Retrieved from https://idiyas.com/inventor/yiyi-li-5g7mwuuy

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Yiyi Li - Innovator in Pressure Gauge Technology.

Introduction

Yiyi Li is a talented inventor based in East Newark, NJ (US). She has made significant contributions to the field of pressure gauge technology. With a focus on innovation, Yiyi has developed a patent that showcases her expertise and creativity.

Latest Patents

Yiyi Li holds a patent for a pressure gauge, which demonstrates her ability to create practical solutions in engineering. This invention is a testament to her skills and dedication to advancing technology. She has 1 patent to her name, reflecting her commitment to innovation.

Career Highlights

Yiyi is currently employed at Navac Inc., where she continues to work on developing cutting-edge technologies. Her role at the company allows her to apply her knowledge and skills in a collaborative environment. She is recognized for her contributions to the team and the industry.

Collaborations

Yiyi has worked alongside talented colleagues, including Zhukai Zhang and Lintao Lu. These collaborations have enriched her experience and fostered a creative atmosphere for innovation.

Conclusion

Yiyi Li is an accomplished inventor whose work in pressure gauge technology exemplifies her innovative spirit. Her contributions to Navac Inc. and her collaborations with fellow inventors highlight her impact on the field. Yiyi's journey as an inventor is one to watch as she continues to push the boundaries of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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