Rochester, NY, United States of America

Yiyi Guan

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Navitar, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yiyi Guan. Retrieved from https://idiyas.com/inventor/yiyi-guan-9tptru1u

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Yiyi Guan and High Numerical Aperture Imaging

Introduction

Yiyi Guan is an inventor associated with Rochester, New York, and Navitar, Inc. Her patent work includes an imaging device designed to support high numerical aperture microscopy.

Latest Patents

Guan is credited with 1 patent: “High Numerical Aperture Imaging Device.” The patent describes a microscope assembly with an objective lens and an infinite conjugate tube lens. It specifies an objective lens effective focal length of no more than 80 mm, a microscope numerical aperture of at least 0.14, and magnification of at least 2×.

Career Highlights

Guan’s listed invention focuses on microscope optics and imaging performance. The patent’s design parameters describe an assembly intended to combine relatively short objective-lens focal length with specified numerical aperture and magnification.

Collaborations

Guan’s listed coworkers include Michael Brindak and Julian Goldstein. Her association with Navitar, Inc. connects her work to a company involved in optical and imaging technologies.

Conclusion

Yiyi Guan’s patent documents a microscope assembly with defined focal-length, numerical-aperture, and magnification characteristics, highlighting her contribution to imaging technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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