Beijing, China

Yiyang Dai

This inventor holds 1 USPTO granted patent. Top assignee: Tsinghua University. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yiyang Dai. Retrieved from https://idiyas.com/inventor/yiyang-dai

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Yiyang Dai: Innovator in Fault Diagnosing Methods

Introduction

Yiyang Dai is a prominent inventor based in Beijing, China. He has made significant contributions to the field of fault diagnosing methods, particularly through his innovative patent. His work is recognized for its potential to enhance technological processes and improve operational efficiency.

Latest Patents

Yiyang Dai holds a patent for a fault diagnosing method based on a simulated vaccine. This method involves establishing a dynamic simulation model to simulate both start-up and steady-state operations of a technological process. The process includes extracting data from simulated normal and fault sample sets to generate corresponding vaccines, which are then used to create antibody libraries for diagnosing faults.

Career Highlights

Dai is affiliated with Tsinghua University, where he continues to advance his research and development efforts. His work has garnered attention for its innovative approach to fault diagnosis, showcasing his expertise in the field.

Collaborations

Yiyang Dai collaborates with notable colleagues, including Jinsong Zhao and Yidan Shu. Their combined efforts contribute to the advancement of research in fault diagnosing methods and related technologies.

Conclusion

Yiyang Dai's contributions to fault diagnosing methods highlight his innovative spirit and dedication to improving technological processes. His work at Tsinghua University and his patent reflect his commitment to advancing the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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