Shenzhen, China

Yixi Peng

This inventor holds 1 USPTO granted patent. Top assignee: Anker Innovations Technology Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yixi Peng. Retrieved from https://idiyas.com/inventor/yixi-peng-ndmf8t9b

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Yixi Peng and Lock-Control Innovation.

Introduction

Yixi Peng is an inventor based in Shenzhen, China. His patent work includes a lock-control method designed to detect and signal whether a lock is in its locked or unlocked state. The provided information lists 1 patent and identifies Anker Innovations Technology Co., Ltd. as his company.

Latest Patents

Peng’s listed patent is “Control Method for Locking and Unlocking Locks.” The disclosure describes a lock with a rotating component that moves a retractable latch bolt. A trigger component attached to the rotating component interacts with two sensing components positioned to correspond to the lock’s unlocked and locked states. When the trigger reaches either position, the corresponding sensor generates a signal indicating that state.

Career Highlights

The available information connects Peng’s patent activity with Anker Innovations Technology Co., Ltd. His listed invention focuses on sensing and signaling the position of a lock’s rotating component, providing a method for distinguishing between locked and unlocked states.

Collaborations

Junnan Li and Da Liang are identified as Peng’s coworkers. The provided information does not specify their roles in the patent or describe particular collaborative work.

Conclusion

Yixi Peng’s listed patent addresses lock-state detection through coordinated rotating, triggering, and sensing components, reflecting his documented contribution to lock-control technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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