Hong Kong, China

Yiu Kwong Wan

This inventor holds 21 USPTO granted patents. Top assignees: Fee Tat Holdings (h.k.) Limited, Andis Company, Lee Tack Stationary Manufactory Limited. Active years: 1997-2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yiu Kwong Wan. Retrieved from https://idiyas.com/inventor/yiu-kwong-wan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 85.7

Average Co-Inventor Count = 1.2

ph-index = 9

Forward Citations = 241(Granted Patents)


Company Filing History:


Years Active: 1997-2016

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21 patents (USPTO):Explore Patents

Title: Yiu Kwong Wan - Innovator from Hong Kong

Introduction: Yiu Kwong Wan is a renowned inventor hailing from Hong Kong, China, known for his groundbreaking contributions to various fields through his innovative creations.

Latest Patents: Yiu Kwong Wan holds several patents in the areas of technology and healthcare, showcasing his continuous dedication to advancing these industries.

Career Highlights: Throughout his career, Yiu Kwong Wan has demonstrated a keen ability to identify gaps in existing technologies and develop solutions that address these challenges effectively. His work has significantly impacted the way we approach problem-solving in the modern world.

Collaborations: Yiu Kwong Wan has collaborated with leading research institutions and companies to further enhance the impact of his inventions. His partnerships have led to the development of cutting-edge products that have improved the lives of many.

Conclusion: Yiu Kwong Wan's passion for innovation and his relentless pursuit of excellence have solidified his reputation as a pioneering inventor in Hong Kong and beyond. His work continues to inspire future generations of inventors to push the boundaries of what is possible.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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