Shanghai, China

Yiran Li

This inventor holds 1 USPTO granted patent. Top assignee: Marvellworld Trade Ltd.. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yiran Li. Retrieved from https://idiyas.com/inventor/yiran-li-2kvfyg35

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 5.0

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Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Yiran Li - Innovator in Touch Detection Technology

Introduction

Yiran Li is a prominent inventor based in Shanghai, China. He has made significant contributions to the field of touch detection technology. His innovative work has led to the development of a patented system that enhances the functionality of touch panels.

Latest Patents

Yiran Li holds a patent for "Systems and methods for capacitive touch detection." This patent describes a system that includes a sensing capacitive network, an internal capacitive network, a comparative network, and a signal processing component. The system is designed to generate a touch-sensing signal based on touch panel capacitance and to determine whether a touch event occurs on the touch panel.

Career Highlights

Yiran Li is currently employed at Marvell World Trade Ltd., where he continues to innovate in the field of touch detection. His work has been instrumental in advancing the technology used in various electronic devices.

Collaborations

Yiran has collaborated with notable colleagues, including Dechao Meng and Hao Zhou. Their combined expertise has contributed to the success of their projects and innovations.

Conclusion

Yiran Li's contributions to touch detection technology exemplify the impact of innovative thinking in the tech industry. His patent and ongoing work at Marvell World Trade Ltd. highlight his role as a key player in advancing this essential technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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