Shandong, China

Yiran He

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Shandong Computer Science Center (National Supercomputer Center in Jinan). Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yiran He. Retrieved from https://idiyas.com/inventor/yiran-he

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 9.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Yiran He: Innovator in Data Caching Technology

Introduction

Yiran He is a notable inventor based in Shandong, China. He has made significant contributions to the field of data caching technology. His innovative approach aims to enhance user experience through improved data management.

Latest Patents

Yiran He holds a patent for a "Data caching method and storage medium." This patent involves a sophisticated process of acquiring network status data between user equipment (UE) and various network components. The method determines whether a cache is configured for the UE based on quantized Quality of Experience (QoE) values, ultimately improving the quality of user experience.

Career Highlights

Yiran He is affiliated with the Shandong Computer Science Center, also known as the National Supercomputer Center in Jinan. His work at this institution has allowed him to focus on cutting-edge research in data caching and network optimization.

Collaborations

Yiran collaborates with talented individuals such as Meng Sun and Wei Zhang. Their combined expertise contributes to the advancement of technology in their field.

Conclusion

Yiran He is a prominent figure in the realm of data caching, with a patent that showcases his innovative thinking. His work continues to influence the quality of user experience in data management systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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