Wuhan, China

Yinglong Wang

This inventor holds 2 USPTO granted patents. Top assignee: Wuhan United Imaging Healthcare Co., Ltd.. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yinglong Wang. Retrieved from https://idiyas.com/inventor/yinglong-wang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 9.0

ph-index = 1


Company Filing History:


Years Active: 2023

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2 patents (USPTO):Explore Patents

Title: Innovations in Orthosis Design by Yinglong Wang

Introduction

Yinglong Wang is a notable inventor based in Wuhan, China. He has made significant contributions to the field of orthosis design, holding two patents that showcase his innovative approach to healthcare technology.

Latest Patents

Wang's latest patents focus on systems and methods for orthosis design. The first patent describes a method that includes obtaining a three-dimensional (3D) model associated with a subject. It also involves acquiring one or more reference images related to the subject. Based on the 3D model and the reference images, the method determines orthosis design data for the subject. This data is crucial for creating a customized orthosis tailored to the individual's needs.

Career Highlights

Yinglong Wang is currently employed at Wuhan United Imaging Healthcare Co., Ltd. His work at this company emphasizes the integration of advanced imaging technologies with innovative design methodologies in healthcare.

Collaborations

Wang collaborates with talented coworkers, including Jing Gao and Qiang Shen, who contribute to the development of cutting-edge healthcare solutions.

Conclusion

Yinglong Wang's contributions to orthosis design reflect his commitment to improving patient care through innovative technology. His patents demonstrate the potential for personalized healthcare solutions that can significantly enhance the quality of life for individuals in need.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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