New Taipei, Taiwan

Ying Wei Tseng

This inventor holds 1 USPTO granted patent. Top assignee: Industrial Technology Research Institute. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ying Wei Tseng. Retrieved from https://idiyas.com/inventor/ying-wei-tseng-7dtnmdza

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Ying Wei Tseng: Quantum Circuit Analysis Innovation

Introduction

Ying Wei Tseng is an inventor based in New Taipei, Taiwan. His work includes an invention applying quantum circuits to Monte Carlo analysis. The provided information lists 1 patent and identifies the Industrial Technology Research Institute as his company.

Latest Patents

Tseng’s listed patent is titled “Electronic Device and Method for Performing Monte Carlo Analysis Based on Quantum Circuit.” It describes exciting multiple qubits into different states using quantum gates, then randomly selecting a sampled result from the quantum circuit’s operation results through a probability measurement circuit. A statistics computing circuit uses the measured samples to calculate a probability statistic and obtain an average value. This approach connects quantum operations with Monte Carlo analysis.

Career Highlights

The available information associates Tseng with the Industrial Technology Research Institute, a research organization, and identifies his patent as an application of quantum computing to statistical analysis. The invention’s described components include quantum gates, a probability measurement circuit, and a statistics computing circuit.

Collaborations

Jason Gemsun Young is identified as Tseng’s coworker. The provided information does not specify their roles or describe a particular joint project.

Conclusion

Ying Wei Tseng’s listed invention explores how quantum circuits can support Monte Carlo analysis by sampling operation results and computing an average value.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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