Nashville, TN, United States of America

Ying T Lee

This inventor holds 1 USPTO granted patent. Top assignee: Ammco Tools Technology Corporation. Active years: 1994.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ying T Lee. Retrieved from https://idiyas.com/inventor/ying-t-lee

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 1994

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1 patent (USPTO):Explore Patents

Title: Innovations by Ying T Lee

Introduction

Ying T Lee is an accomplished inventor based in Nashville, TN. He has made significant contributions to the field of vehicle technology, particularly in the evaluation of steerable wheels. His innovative approach has led to the development of a unique patent that enhances vehicle performance.

Latest Patents

Ying T Lee holds a patent for "Improvements in the method and apparatus for evaluating the TOOT." This invention focuses on determining the change in the toe of steerable wheels when the inside wheel is turned. The method involves turning the inside wheel through an angle of ten degrees, measuring the resulting change in toe, and multiplying that measurement by four. This innovative technique provides a more accurate evaluation of vehicle steering dynamics.

Career Highlights

Ying T Lee is currently employed at Ammco Tools Technology Corporation, where he continues to work on advancements in automotive technology. His expertise and dedication to innovation have made him a valuable asset to the company.

Collaborations

Ying T Lee collaborates with his coworker, Phillip A Spainhour, to further enhance their projects and drive innovation within their field.

Conclusion

Ying T Lee's contributions to vehicle technology through his patent demonstrate his commitment to innovation and improvement in automotive performance. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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