Ying Long

Title: Ying Long - Innovator in Analog Circuit Fault Diagnosis

Introduction

Ying Long is a prominent inventor based in Anhui, China. He has made significant contributions to the field of analog circuit fault diagnosis, holding a total of 2 patents. His innovative methods have advanced the accuracy and reliability of fault mode classification in analog circuits.

Latest Patents

Ying Long's latest patents include an "Analog Circuit Fault Mode Classification Method" and an "Analog Circuit Fault Diagnosis Method Using Single Testable Node." The first patent outlines a systematic approach to classify fault modes in analog circuits through data collection, feature extraction, and machine learning techniques. This method emphasizes simplicity in learning and training while ensuring high accuracy in mode classification. The second patent presents a method that utilizes a single testable node to diagnose faults by transforming a single signal into multiple signals, thereby preserving original measurement information. This innovative approach allows for the extraction of independent fault mode features, facilitating effective classification of circuit faults.

Career Highlights

Ying Long is affiliated with Hefei University of Technology, where he continues to engage in research and development in the field of analog circuits. His work has garnered attention for its practical applications in improving circuit reliability and performance.

Collaborations

Ying Long has collaborated with notable colleagues, including Lifen Yuan and Yigang He. Their combined expertise contributes to the advancement of research in analog circuit diagnostics.

Conclusion

Ying Long's contributions to analog circuit fault diagnosis through his innovative patents demonstrate his commitment to enhancing technology in this field. His work not only reflects his expertise but also paves the way for future advancements in circuit reliability.