Hefei University of Technology

Ying Long

Yigang He

Chaolong Zhang

Deqin Zhao

Zhijie Yuan

Lifen Yuan

Zhen Cheng

Lei Wu

Peng Chen

Yesheng Sun

Shuai Luo

An analog circuit fault mode classification method comprises the following implementation steps: (1) collecting M groups of voltage signal sample vectors Vto each of fault modes Fof the analog circuit by using a data collection board; (2) sequentially extracting fault characteristic vectors Vof the voltage signal sample vectors Vby using subspace projection; (3) standardizing the extracted fault characteristic vectors Vto obtain standardized fault characteristic vectors; (4) constructing a fault mode classifier based on a support vector machine, inputting the standardized fault characteristic vectors, performing learning and training on the classifier, and determining structure parameters of the classifier; and (5) completing determination of fault modes according to fault mode determination rules. The fault mode classifier of the present invention is simple in learning and training and reliable in mode classification accuracy.

Analog circuit fault mode classification method

An analog circuit fault diagnosis method using a single testable node comprises the following steps: (1) obtaining prior sample data vectors under each fault mode; (2) computing a statistical average of the prior sample data vectors under each of the fault modes; (3) decomposing a signal by an orthogonal Haar wavelet filter set; (4) extracting the feature factor of the prior sample fault modes; (5) extracting a fault-mode-to-be-tested feature factor; (6) computing a correlation coefficient matrix and correlation metric parameters between the feature factor of the prior sample fault modes and the feature factor of the fault-mode-to-be-tested; and (7) determining a fault mode according to a maximal correlation principle by comparing the correlation metric parameters. The method can convert a single signal into a plurality of signals without losing original measurement information, and extract an independent fault mode feature factor reflecting variations of a circuit structure in different fault modes, can be used to study an associated mode determination rule and successfully complete classification of circuit fault modes.

Analog circuit fault diagnosis method using single testable node

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Anhui, China

Ying Long